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A Charge Compensation Phototransistor for High-Dynamic-Range CMOS Image Sensors

发布时间:2019-06-11
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论文类型:
期刊论文
发表时间:
2018-07-01
发表刊物:
IEEE TRANSACTIONS ON ELECTRON DEVICES
收录刊物:
SCIE
文献类型:
J
卷号:
65
期号:
7
页面范围:
2932-2938
ISSN号:
0018-9383
关键字:
Charge compensation phototransistor; CMOS image sensor (CIS); high-dynamic range (HDR)
摘要:
This paper presents a charge compensation phototransistor for high-dynamic-range CMOS image sensors (CIS). With a built-in charge compensation mechanism, the photoresponse of the proposed device can switch between the linear mode and the logarithmic mode automatically, according to the incident light intensity. In particular, the device does not saturate until approximately 0.5 W/cm(2), almost 5 times the brightness of the sun. Therefore, CIS with this proposed phototransistor demonstrates a measured dynamic range of 167 dB, and an output swing of more than 2 V without amplification. The nonideal behavior of the proposed device due to the thermal effect and the parasitic resistances is investigated when exposed with high incident light intensity. In addition, the nonuniform response of the pixel array is exhibited and analyzed.
第一作者
Cui, Shuang
合写作者
Chang, Yuchun,Yang, Xiaotian,Wang, Xinyang,Li, Zhaohan,Wang, Chao
通讯作者
Chang, YC (reprint author), Jilin Univ, Coll Elect Sci & Engn, State Key Lab Integrated Optoelect, Changchun 130012, Jilin, Peoples R China.

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